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Svitasheva S.N. Metod ellipsometrii dlya issledovaniya nanorazmernykh plenok dielektrikov, poluprovodnikov i metallov/Svitasheva S.N. Method of ellipsometry for the study of nanoscale films of dielectrics, semiconductors and metals In Russian - landofmagazines.com

TransliterationSvitasheva S.N. Metod ellipsometrii dlya issledovaniya nanorazmernykh plenok dielektrikov, poluprovodnikov i metallov

In EnglishSvitasheva S.N. Method of ellipsometry for the study of nanoscale films of dielectrics, semiconductors and metals In Russian

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Publication Date: 2019

Publication Place: Novosibirsk

Description: Short description: In Russian .Novosibirsk Publishing House of Siberian Branch of Russian Academy of Sciences 2009. 268s. Please feel free to contact us for a detailed description of the copies available. SKUalb1e227d84d36400f4

SKU: alb1e227d84d36400f4

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TransliterationSvitasheva S.N. Metod ellipsometrii dlya issledovaniya nanorazmernykh plenok dielektrikov, poluprovodnikov i metallov

In EnglishSvitasheva S.N. Method of ellipsometry for the study of nanoscale films of dielectrics, semiconductors and metals In Russian

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