TransliterationBouen D.K., Tanner B.K. Vysokorazreshayushchaya rentgenovskaya difraktometriya i topografiya.
In EnglishBowen D.K., Tanner B.K. High-resolution X-ray diffractometry and topography. In Russian
$199
$199
Publication Date: 2002
Publication Place: Moscow
Description: Short description: In Russian.M. Science 2002. 274s. Please feel free to contact us for a detailed description of the copies available. SKUalbd87a5246335a9325
SKU: albd87a5246335a9325